韩国Micro Pioneer XRF 2000R元素分析仪(含ROSH分析)镀层测厚仪

韩国Micro Pioneer XRF 2000元素分析仪/镀层测厚仪(双功能)

Micro Pioneer XRF-2000R X光镀层测厚仪及ROHS原素分析仪

是在XRF-2000系列测厚仪的基础上增加了元素分析及有害物质检测的功能，

其物点为：高分辨率，固态探测器;可分析超薄样品

分析有害物质，元素分析分之ppm - 100％,符合RoHS / WEEE标准测试以及ELV指令优化的应用;

可测量多层镀层厚度及锡铅成分分析；

电镀溶液分析；

定性分析超过30种元素,能够测量液体，固体，粉末，薄膜和不规则形状；

贵金属元素含量和分析（金，银，铂，和珠宝）；

自动过滤器，多准直仪(五个准直器，从0.1mm-3.0mm)和全自动XYZ移动样品台；

性价比超强的元素分析及镀层测厚双功能分析仪器

仪器尺寸：W610mm D670mm H490mm,重量：75Kg (net)

可测量样器大小：W550mm D550mm H30mm

Elemental Analyzer/Coating Thickness Gauge(Dual System)

Fast and Non-destructive multiple elements analysis from 0.1ppm to 100wt%

No sample preparations for solids, liquids, powders, films, coatings irregular shapes, particles

Laser focused Positioning System

User friendly interface, Easy of use Software

Low cost with sufficient customer support

Application of Multi Purpose System

Fully compliant with RoHS, WEEE, ELV optimized application

Precious Metal Analysis application (Gold, Silver, Platinum other Jewelry etc.)

Thin film or complex multi-layer plating Thickness Measurement application

Other customer interesting elements analysis application

XRF-2000R software has independent windows in each function. At the same time measuring, it is possible to view camera monitor and analysis qualitatively and process statistically. The system send measurement data to Microsoft Excel and other programs.

By clicking desired location of camera monitor, Point and Shoot function can fit that location to measure automatically with stage control system.

The XRF-2000R can process multiple type of statistics and reports including Xbar-Rs chart, Histogram etc. also support various interface for the resulting values (Excel, HTML and database formats)

Provides sample and analysis data and determines compliance with applied regulations in real-time.

Technical Data

Chamber size: Slotted chamber W610mm D670mm H490mm, Weight 75Kg (net) Useable sample area W550mm D550mm H30mm

X-Ray tube : Rh(Ag, Mo) target, 1-50KV, 1.0mA current. Micro Focused

Filer system:5 filter with auto-changer primary filter system

Collimator system: form 0.1mm to 3.0mm up to 6 collimators with auto collimator changer Customer selected collimator size (optional for special application)

X-Ray Detector: Electronic Peltier cooled Silicon semiconductor (PIN diode) detector No liquid nitrogen gas, detector resolution 149eV FWHM at 5.9Kev

Video system: color CCD camera magnification approx, 20X zoom depend on monitor size or 100X zoom (optional) Electronic crosshair with Collimator Circle

Analysis Sample: Solid, liquid & Powder

Detection Range: From Al(13) to U(92) 1ppm – 100wt% (Vacuum Optional)

Radiation safety: Fully protected, fail safe system auto shut down regarding door sensor,shutter sensor, temperature sensor, designed X-Ray safety

Main supply: 110/220V AC power 50/60Hz

Spectrum processing: Digital Pulse Processing. Auto Peak ID, Various Intensity method -Gross, Net, Digital Filter, background removal

Deadtime correction, density correction, Spectrum auto-scaling

Control system: Desktop or notebook with windows 2000/XP/Vista environment

RoHS WEEE ELV optimized application

FP method: Qualitative material analysis up to 30 elements without sample preparation

Calibration method: Quantitative material analysis with standards calibration

Plating thickness measurement application up to 6 layers

Data output: MS-EXCEL or HTML or database format user creative customized report

Here is some result about precious metal analysis and PVC sample for RoHS analysis

Measuring Condition :

Measurement Time: 100 s

10 times measurement each sample.

Tested Standards are certificated by

wet chemical analysis and ICP-AES,MS.

We provide elements analysis or thickness

determination, Contact us today for the solution of your Quality control problems.